Abstract
κ-alumina films were deposited on WC-Co alloy by a CVD method with an under layer of TiC. Powder samples were also prepared by disolving steel sheets on which TiC/Al2O3 or TiC/Al2O3/TiN were deposited. These specimens were examined by X-ray diffraction to obtain more exact diffraction data for practical use.
Diffraction profiles of the films and the powders were analyzed with a hexagonal system. CVD-coated films showed strong orientation, namely c-axis being rectangular to the film plane. κ-Al2O3 has lattice constants of a0=9.632A and c0=8.929A as a hexagonal system. These values correspond to a0=4.816A, b0=8.342A and c0=8.929A of an orthorhombic system.
