Journal of the Japan Society of Powder and Powder Metallurgy
Online ISSN : 1880-9014
Print ISSN : 0532-8799
ISSN-L : 0532-8799
Surface Reaction Analysis by X-Ray Photoelectron Spectroscopy Using Synchrotron Radiation and Microstructure Analysis of AIN Layer Produced by In-Situ Direct Nitriding Process
Katsuyoshi KondohAtsushi KimuraYoshinobu Takeda
Author information
JOURNAL OPEN ACCESS

1999 Volume 46 Issue 8 Pages 801-810

Details
Abstract
In-Situ direct nitriding process to produce AIN in aluminum alloy powder by utilizing the reaction between aluminum and nitrogen gas at temperatures below 823K has been developed. Topmost-surface analysis by X-ray Photoelectron Spectroscopy using Synchrotron Radiation (SR-XPS) was conducted and chemical bonding changes on aluminum powder surface during heating were investigated. Deoxidization of aluminum oxide (Al2O3) surface film by Mg contented in the powders occurred over 670K and Al2O3 film was deoxidized and reduced. After the deoxidization of Al2O3 surface film, aluminum in powder reacted with nitrogen gas and AIN layer was produced upon the powder surface. In-Situ reacted AIN had a good bonding with aluminum matrix and showed a laminar structure with a layer thickness of 20-30nm. The content of reacted AIN strongly depends on a period of heating in nitrogen gas and on surface area of raw powder.
Content from these authors
© Japan Society of Powder and Powder Metallurgy

本論文はCC BY-NC-NDライセンスによって許諾されています.ライセンスの内容を知りたい方は,https://creativecommons.org/licenses/by-nc-nd/4.0/deed.jaでご確認ください.
https://creativecommons.org/licenses/by-nc-nd/4.0/deed.ja
Previous article Next article
feedback
Top