Abstract
The application of thermal microscope to the measurement of local thermal properties has drawn considerable scientific interest. We report the application of a thermal microscope to the measurement of thermal effusivity for films comprising alumina deposited on a substrate, which were fabricated by an electrophoretic deposition method. The measured data was analyzed to consider the undulations on the sample surface. For these samples, it is expected that unsteady heat flow conditions will affect the measurements. The thermal effusivity of these samples was about 1×10³ Js-0.5m-2K-1; this value is smaller than that for dense alumina because an alumina grain make contact with a point.
