Journal of Light & Visual Environment
Online ISSN : 1349-8398
Print ISSN : 0387-8805
ISSN-L : 0387-8805
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Influence of the Duty Cycle on the Time Behaviour of the VUV-Radiation and Densities of Excited Atoms in the Medium Pressure Xenon Discharge
Eckhard KINDELConrad SCHIMKE
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1996 Volume 20 Issue 2 Pages 2_34-2_38

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Abstract
A comparison between the dc and the pulsed medium pressure discharge in Xenon (10...100 Torr) has shown that a significantly higher VUV-radiation (140 to 180 nm) occurs in the pulsed discharge (rectangular pulses in the frequency range of some kHz). For a pulse repetition frequency of 6 kHz and a pulse current of 250 mA measurements of the VUV-radiation and the density of excited atoms (1s5,1s4) in dependence on the duty cycle are presented. It is shown, that the mean value of the VUV-radiation reaches a maximum in dependence on the duty cycle. The enhanced radiation in the pulsed mode is connected with the effect of dissociative recombination and the formation of excimer states.
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© 1996 The Illuminating Engineering Institute of Japan
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