Abstract
In-plane crystalline orientation of a longitudinal thin film medium was investigated to clarify therelation between the crystalline orientation and the magnetic anisotropy. The anisotropy is induced by deposition with moving disk substrate (transport deposition) and changed by texturing on the substrate, as is well-known. It has heretofore been difficult to measure the crystalline orientation by X-ray diffraction because of the giant background reflection. We have developed a precise background correction method in order to measure the pole figure of the longitudinal medium. In conclusion, it is clear that the c-axis of the medium on a plane substrate is almost oriented to the moving direction of the substrate and the axis of the medium on a textured substrate has a tendency to orient to the texturing direction.
