Abstract
The properties of SmCo/Cr bilayer films with underlayers prepared at various Ar gas pressures (PAr) and substrate temperatures (Ts) were studied. When PAr was increased from 0.13 Pa to 1.06 Pa or Ts was increased from 50°C to 190°C, the intensity of the X-ray diffraction line from the Cr(110) plane became weak. The coercivity, squareness ratio, and coercivity squareness ratio of the SmCo layer increased with an increase in the intensity of X-ray diffraction. The magnetic properties of the SmCo layer were found to improve according to the emphasized crystal structure of the Cr underlayer.
