Characterization of Laser-Annealed Magnetic Garnet Films by Scanning Probe Microscopy

Abstract

Surface damage and magnetic structures in laser-annealed magnetic garnet films investigated by the use of scanning probe microscopes, were i.e., Atomic Force Microscope (AFM), Magnetic Force Microscope (MFM), and Near-field Scanning Optical Microscope (NSOM). AFM images showed the atomically flat surface of the laser-annealed region in which the growth-induced magnetic anisotropy was strongly reduced. MFM and NSOM images showed sharp changes in the direction of magnetization at the boundary between the laser-annealed region and laser-annealed region. These results show that the laser-annealing technique is very useful for fabricating waveguide optical isolators.