Abstract
The magnetic properties and magnetoresistance of FexCo1-x-Al2O3 thin films were studied by changing the target-substrate distance (DT-S) from 65 to 120 mm. The films were prepared by rf magnetron sputtering. The MR ratio of Fe0.2Co0.8-Al2O3 thin films increased with increasing DT-S. An MR ratio of 7.3% was obtained in a film with DT-S of 120 mm at room temperature. The MR ratio and the MR sensitivity of FexCo1-x-Al2O3 thin films exhibited a maximum at about x = 0.2. From an analysis of the structure, it is considered that the enhancement of the MR ratio is related to enlargement and small distribution of the macroscopic grain size in the films.