1999 Volume 23 Issue S_1_MORIS_99 Pages S1_85-86
A series of epitaxial films with nominal composition Co3Pt were grown over a range of growth temperatures from 450 K to 950 K. With increasing growth temperature the crystalline structure of the films varies, and there is an associated variation of the perpendicular magnetic anisotropy constant. A study has been made of the magnetic domain structures which evolve in the series of films under different magnetizing conditions. Quantitative measurements have been made of characteristic domain widths determined from MFM measurements, and it has been found that the widths are directly proportional to the perpendicular anisotropy constants.