LLG Simulations for Thermal Stability of Submicron Permalloy Thin Films

Abstract

Thermal stability of submicron size permalloy thin films was investigated both by the Langevin LLG simulation and by the energy reconstruction method. The former gives the reversal time due to thermal fluctuation, and the latter, the potential energy profile of the films. The results were consistent with each other. The relation between the reversal time and energy barrier is well established by these methods. The magnetization behavior before reversal at finite temperature is visualized by a combination of these methods.