Measurements of Magnetization Processes of Thin Film Heads Using Micro-Kerr Method

Abstract

The magnetization processes at the small area of the thin films and of the thin film heads have been studied by using the micro-Kerr effect method. The domain wall position be observed by the change of the polarity of the cross field magnetization curves in the rotational magnetization process. The equi-coercive force curves are the domain wall positions in the domain wall movement process. The magnetization processes for the upper magnetic yokes of the thin film heads were measured with this method.