Perpendicular Anisotropy In FeCr Sputtered Films

Abstract

Magnetic thin films of Fe_1-xCr_x (x=0.33 to 0.40) with perpendicular magnetization were obtained using the rf sputtering method for the first time. Fe₆₆Cr₃₄ deposited onto unheated substrate had K_u 6 × 10⁵ erg/cm³, M_s 280 emu/cm³ and H_c⊥ 700 Oe. Film composition and substrate temperature during film preparation were the most important factors inducing perpendicular anisotropy. X-ray diffraction studies showed that the induction of perpendicular anisotropy was always accompanied by growth of the crystalline phase (Cr-dominan bcc phase). FeCr films also exhibited high corrosion resistivity in an oxidative environment. FeCr is a potential material for perpendicular magnetic recording.