The collection efficiency f-value of a parallel-plate ionization chamber exposed to a pulsed X-ray field of high exposure rate has been discussed. The dependence of the f-value upon various parameters was clarified by numerical calculations of the rate equations for positive and negative ions. The saturation curve was also obtained with the normalized variables. A method was proposed for determining the f-value in an unknown pulsed X-ray field. It was found that the true f-value could be evaluated by fitting a normalized saturation curve to several ionic charges at different applied voltages. Experiments were carried out in a pulsed X-ray field generated by an electron linear accelerator, and the effectiveness of the method was confirmed.
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