Journal of Nuclear Science and Technology
Online ISSN : 1881-1248
Print ISSN : 0022-3131
Total Dose Effect on Power Supply Current of Large Scale Integrated Circuits
Hiroshi KAMIMURA
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Keywords: radiation effects, cobalt 60, irradiation, total dose effects, radiation doses, dose rate, integrated circuit, MOS transistors, leakage current, power supply current
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1993 Volume 30 Issue 3 Pages 266-269

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