Abstract
For effective use of technical information, various analytical tools and methods (e.g., patent map analysis) have been proposed. It was against this background that the “PAT-LIST Research Workshop” (supported by Raytec Co., Ltd.) was established in 2006. This article discusses, as an example, some actual research subject that the author as an adviser to the forum has studied through our activities in the past six years, especially the subject for 2010 (unveiling intellectual property strategies of specified enterprises from technical information analysis results). Practically useful analysis methods will be proposed showing some points of notes in analysis about the methods. What is also introduced is macroanalysis using text mining tools and the significance of controlled technical classification in a problem/solution map for determining critical fields.
