Meeting Abstracts of the Physical Society of Japan
Online ISSN : 2189-0803
ISSN-L : 2189-0803
53.2.2
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Thickness dependence of carrier-electron states in doped semiconductor films
T. INAOKA, A. NISHIDA, M. HASEGAWA
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CONFERENCE PROCEEDINGS FREE ACCESS

Pages 182-

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© 1998 The Physical Society of Japan
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