Structural analysis of In/Si(111) surfaces by correlated thermal diffuse scattering

Meeting Abstracts of the Physical Society of Japan

Online ISSN : 2189-0803
ISSN-L : 2189-0803

55.1.4

DOI https://doi.org/10.11316/jpsgaiyo.55.1.4.0_752_2

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Structural analysis of In/Si(111) surfaces by correlated thermal diffuse scattering

T. Abukawa, K. Yoshimura, S. Kono

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CONFERENCE PROCEEDINGS FREE ACCESS

Pages 752-

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© 2000 The Physical Society of Japan

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