60.2.4
Session ID : 20aYC-4
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20aYC-4 Resistance ridges along filling factor v=4i in silicon based two-dimensional electron systems
K. Takashina, M. Brun, D. K. Maude, T. Ota, A. Fujiwara, Y. Ono, H. Inokawa, Y. Takahashi, Y. Hirayama
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