20aPS-31 円偏光軟X線Auger・光電子回折を用いたEtOH/Si(111)7×7及びO_2/Si(111)7×7の三次元的構造解析(ポスターセッション,領域9,表面・界面,結晶成長)

成川 隆史; 松井 文彦; 加藤 有香子; 稲地 加那子; 酒井 智香子; 松下 智裕; 郭 方准; 大門 寛

doi:10.11316/jpsgaiyo.62.1.4.0_901_4

Meeting Abstracts of the Physical Society of Japan

Online ISSN : 2189-0803
ISSN-L : 2189-0803

62.1.4

Session ID : 20aPS-31

DOI https://doi.org/10.11316/jpsgaiyo.62.1.4.0_901_4

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20aPS-31 Three-dimensional structural analysis of EtOH/Si(111)7×7 and O_2/Si(111)7×7 by circularly polarized soft X-ray Auger・photoelectron diffractions

T. Narikawa, F. Matsui, Y. Kato, K. Inaji, C. Sakai, T. Matsushita, F. Z. Guo, H. Daimon

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