Meeting Abstracts of the Physical Society of Japan
Online ISSN : 2189-0803
ISSN-L : 2189-0803
63.1.4
Session ID : 25pTD-1
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25pTD-1 Formation of atomically smooth SiO_2/Si(111) structure with low leakage current density by nitric acid oxidation method
Woo-Byoung Kim, Takeshi Matsumoto, Hikaru Kobayashi
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© 2008 The Physical Society of Japan
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Meeting Abstracts of the Physical Society of Japan

Meeting Abstracts of the Physical Society of Japan

Meeting Abstracts of the Physical Society of Japan

Meeting Abstracts of the Physical Society of Japan

Meeting Abstracts of the Physical Society of Japan

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Meeting Abstracts of the Physical Society of Japan

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