66.2.1
Session ID : 16pSK-4
Conference information
16pSK-4 Performance evaluation of Silicon Drift Detectors for a precision X-ray spectroscopy of Kaonic He atom (IV)
Tadashi Hashimoto, [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], H. Bhang, S. Choi, [in Japanese], M. Cargnelli, P. Kienle, J. Marton, F. Widmann, B. Wunsehek, J. Zmeskal, [in Japanese], [in Japanese], C. Curceann, C. Guaraldo, A. Romero Vidal, D. Sirghi, F. Sirghi, O. Vazquez Doce
Author information
Details
Article 1st page
