Meeting Abstracts of the Physical Society of Japan
Online ISSN : 2189-0803
ISSN-L : 2189-0803
67.2.4
Session ID : 20aHB-10
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20aHB-10 Imaging of carrier diffusion at the SiO_2/Si interface by time-resolved photoemission electron microscopy
Y. Yamada, K. Fukumoto, T. Ishikawa, Y. Okimoto, K. Onda, S. Koshihara
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© 2012 The Physical Society of Japan
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