Meeting Abstracts of the Physical Society of Japan
Online ISSN : 2189-0803
ISSN-L : 2189-0803
68.2.4
Session ID : 25aJA-1
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Thickness dependence of topological insulator Bi_2Se_3 ultra-thin film structures studied by x-ray diffraction
M. Sugiki, T. Shirasawa, M. Hashimoto, Y. Yamaguchi, T. Takahashi
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