Meeting Abstracts of the Physical Society of Japan
Online ISSN : 2189-0803
ISSN-L : 2189-0803
70.1
Session ID : 22aAM-6
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22aAM-6 Gate Voltage and Temperature Dependence of Weak Localization Effect in Ti-cleaned Graphene
[in Japanese]C. A. JoinerY. Jiang[in Japanese][in Japanese]Z. JiangE. M. Vogel
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© 2015 The Physical Society of Japan
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