Meeting Abstracts of the Physical Society of Japan
Online ISSN : 2433-1112
48.2
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30p-N-9 Device Length Dependence of Critical Current Density in Quantum Hall State
F. Hayashi, S. Komiyama, S. Fukatsu, Y. Shiraki, R. Ito, H. Toyoshima
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Pages 154-

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© 1993 The Physical Society of Japan
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