50.4
Session ID : 29p-YB-10
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Measurement of Parametric X Radiation from thin Si crystal
K. Goto, K. Aramitsu, I. Endo, T. Horiguchi, V.V. Kapline, T. Kobayashi, T. Kondo, M. Muto, H. Nitta, T. Ohba, A.P. Potylitsin, T. Takahashi, Y. Takashima, K. Yoshida
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