3a-M-11 Hole trapping and atomic displacement due to impurities in amorphous SiO_2

Meeting Abstracts of the Physical Society of Japan

Online ISSN : 2433-1112

51.2

Session ID : 3a-M-11

DOI https://doi.org/10.11316/jpsgaiyog.51.2.0_69_1

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3a-M-11 Hole trapping and atomic displacement due to impurities in amorphous SiO_2

Chioko Kaneta

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© 1996 The Physical Society of Japan

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