Meeting Abstracts of the Physical Society of Japan
Online ISSN : 2433-1171
1995.2
Session ID : 27p-N-1
Conference information
27p-N-1 Direct Observation of Bulk Defects in Semiconductors by Scanning Tunneling Microscopy
K. Fujimoto, Y. Mera, K. Maeda
Author information
CONFERENCE PROCEEDINGS FREE ACCESS

Details
Download PDF (171K)
Download citation RIS

(compatible with EndNote, Reference Manager, ProCite, RefWorks)

BIB TEX

(compatible with BibDesk, LaTeX)

Text
How to download citation
Contact us
Article 1st page
Content from these authors
© 1995 The Physical Society of Japan
Previous article Next article
Favorites & Alerts

Recently viewed articles
Predecessor

Meeting Abstracts of the Physical Society of Japan

Meeting Abstracts of the Physical Society of Japan

Meeting Abstracts of the Physical Society of Japan

Meeting Abstracts of the Physical Society of Japan

Meeting Abstracts of the Physical Society of Japan

Successor

Meeting Abstracts of the Physical Society of Japan

Share this page
feedback
 Top