Meeting Abstracts of the Physical Society of Japan
Online ISSN : 2433-118X
1988.2
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3a-C4-7 Impurity effects of the SiO_2-Si(100)interface studied by Angle-Resolved UPS
[in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japanese]
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CONFERENCE PROCEEDINGS FREE ACCESS

Pages 353-

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© 1988 The Physical Society of Japan
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