Meeting Abstracts of the Physical Society of Japan
Online ISSN : 2433-118X
1992.2
Session ID : 26p-F-4
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26p-F-4 The Structural Analysis of SiO_2 Film on Si(001) Surface by X-ray CTR Scattering
Kohki Nakano, Takayoshi Shimura, Isao Takahashi, Jimpei Harada, Masataka Umeno, Syuichi Samata
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© 1992 The Physical Society of Japan
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