Journal of the Physical Society of Japan
Online ISSN : 1347-4073
Print ISSN : 0031-9015
ISSN-L : 0031-9015
Differential Cross Section Measurements for One-Electron Capture Process in Ar2+--Ne System at Elab=40, 60 and 80, eV
Yoh Itoh
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1994 Volume 63 Issue 3 Pages 941-947

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Abstract

The angular distribution of Ar+ ions produced by one-electron capture process was measured from 0° to 20° with a newly constructed crossed-beam apparatus. Two components were observed in the angular distribution of Ar+, one component is a sharp peak around 0° and the other is a hump around the reduced scattering angle Elab· θ lab=290± 20, eV· deg. Only the following process is considered in the analysis of the experimental results: Ar2+(3P)+Ne(1S0)→ Ar+(2P)+Ne+(2P)+6.1, eV. The experimental results were compared with those obtained by pure classical trajectory calculations taking into account simple interaction potentials. The observed Ar+ ions in the forward peak were considered to be produced in a charge transfer process which occurs in the incoming channel of the trajectory, and the ions in the hump change charge in the outgoing channel.

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© The Physical Society of Japan 1994
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