Extended X-Ray Absorption Fine Structure (EXAFS) in X-ray Fluorescence Spectra

Abstract

Aluminum K-LL radiative Auger X-ray fluorescence spectra of AlPO₄ and Al₂O₃ powders are measured using an X-ray fluorescence spectrometer for elemental analysis. We demonstrate that the Fourier transform of the oscillation in the radiative Auger spectra has information similar to that of the extended X-ray absorption fine structure (EXAFS). The Al--O distances in AlPO₄ and Al₂O₃ are determined by the radiative Auger X-ray fluorescence spectra. The accuracy of the Al--O bond length is within 0.03, Å.