Quantum Transport And Its Scaling Properties in Thue-Morse Waveguides

Ru-Wen Peng; Mu Wang; Guo-Jun Jin; Yu Li; An Hu; Shu-Sheng Jiang

doi:10.1143/jpsj.69.3360

Quantum Transport And Its Scaling Properties
in Thue-Morse Waveguides

Ru-Wen Peng, Mu Wang, Guo-Jun Jin, Yu Li, An Hu, Shu-Sheng Jiang

Author information

Ru-Wen Peng
National Laboratory of Solid State Microstructures, Nanjing University,
Nanjing 210093, China,
and
Center for Advanced Studies in Science and Technology of Microstructures,
Nanjing 210093, China
Mu Wang
National Laboratory of Solid State Microstructures, Nanjing University,
Nanjing 210093, China,
and
Center for Advanced Studies in Science and Technology of Microstructures,
Nanjing 210093, China
Guo-Jun Jin
National Laboratory of Solid State Microstructures, Nanjing University,
Nanjing 210093, China,
and
Center for Advanced Studies in Science and Technology of Microstructures,
Nanjing 210093, China
Yu Li
National Laboratory of Solid State Microstructures, Nanjing University,
Nanjing 210093, China,
and
Center for Advanced Studies in Science and Technology of Microstructures,
Nanjing 210093, China
An Hu
National Laboratory of Solid State Microstructures, Nanjing University,
Nanjing 210093, China,
and
Center for Advanced Studies in Science and Technology of Microstructures,
Nanjing 210093, China
Shu-Sheng Jiang
National Laboratory of Solid State Microstructures, Nanjing University,
Nanjing 210093, China,
and
Center for Advanced Studies in Science and Technology of Microstructures,
Nanjing 210093, China

Keywords: quantum transport, Thue-Morse sequence, scaling properties

JOURNAL RESTRICTED ACCESS

2000 Volume 69 Issue 10 Pages 3360-3365

DOI https://doi.org/10.1143/jpsj.69.3360

Details

Abstract

The quantum transport in Thue-Morse (TM) stub waveguides has been studied by using a transfer matrix method. It is demonstrated that the transmission coefficient and the energy spectrum have a rich structure dependent of the wave vector of electron and the number of the stubs. And the multifractal analysis presents that the electronic transport possesses scaling properties, hence shows a genuine multifractality.

Corresponding author

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