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Takashi Yanagisawa
Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568
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Shigeru Koikegami
Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568
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Hajime Shibata
Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568
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Shinji Kimura
National Metrological Laboratory, National Institute of Advanced Industrial Science and Technology Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568
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Satoshi Kashiwaya
Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568
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Akihito Sawa
Correlated Electron Research Center, National Institute of Advanced Industrial Science and Technology Central 4, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568
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Noritaka Matsubara
Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568 Tsukuba University, 1-1-1 Tennoudai, Tsukuba, Ibaraki 305-8577
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Koki Takita
Tsukuba University, 1-1-1 Tennoudai, Tsukuba, Ibaraki 305-8577