The Soft X-ray Spectroscopy of the Solid State by the Electronic Differentiating Method :

Aluminium L₃

Abstract

A method was developed of observing soft X-ray emission spectra directly on the screen of a cathode-ray oscilloscope. Soft X-rays emitted from metals were detected by a photoelectric device which works under retarding voltages having saw-tooth wave form. The photoelectric current was differentiated three times by electronic differentiating circuits. The saw-tooth wave voltage corresponds to the reciprocal of wavelength, while the differentiated photoelectric current represents the intensity of soft X-ray emission. Using this method we obtained the emission spectra in about 1/100 sec, exposure without serious contamination of the anticathode. As an example, the structure of the L₃ emission spectrum of Al was studied.