Diffraction Fringes of Ripple in Ferromagnetic Thin Films

Takao Suzuki

doi:10.1143/JPSJ.28.920

Abstract

The intensity distribution of ripple structure in ferromagnetic thin films is discussed on the basis of wave optics in the defocused mode of Lorentz microscopy. The ripple angle for a 90% Ni–Fe evaporated thin film was determined to be about 7° experimentally on the basis of the Fresnel diffraction fringes observed.

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