Abstract
The experimental observations on the two X-ray wave fields in elastically distorted silicon single crystals, which were reported in Part I (J. Phys. Soc. Japan 31 (1971) 204), are analysed on the basis of the dynamical diffraction theory. A new technique for computer calculation of propagation paths, phase changes and intensities of the wave-field beams in a distorted crystal is devised. Satisfactory agreements are obtained between experiment and theory for a uniformly curved crystal and a crystal compressed with knife edges. A physical interpretation is given on the asymmetry of the diffraction intensities of the two wave fields with respect to the sign of elastic strain gradient.