Exciton-L0 Phonon Scattering in Cu₂O

Abstract

Reliable absorption line shape of the several higher members of the yellow exciton series in Cu₂O has been measured by the photoelectric method using a monochromator with a large dispersion at 1.8 K, and has been analyzed on the basis of Toyozawa’s formula. The origin of the half width is considered to come from the interband scattering of the exciton from the p state to the 1s state by the two modes of L0 phonons. The estimated ratio in the line width of the n-th member to the second member of the exciton series is in agreement with the experimental one.