Experimental and Monte Calro Studies of Multiple Scattering Correction in the Compton Profile of Aluminum

Fumitake Itoh; Toshihisa Honda; Kenji Suzuki

doi:10.1143/JPSJ.46.1201

Abstract

The Monte Carlo method for correcting the effect of multiple scattering in Compton profile measurements has been extended to take account of the geometry of collimators. This procedure is applied to experimental Compton profiles of aluminum measured with 59.54 keV γ-rays for various sample thickness. It is found that the corrected Compton profiles are independent of the sample thickness within experimental errors. Three theoretical Compton profiles for aluminum are compared with the experimental one.

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