Abstract
X-ray diffraction topographic study of the partly electroded plates of ferroelectric NaNO2 crystals (S. Suzuki and M. Takagi: J. Phys. Soc. Jpn 32 (1972) 1302) has revealed many small regions where the half way state of the rotational motion of NO2 radicals at the time of the polarization reversal had been quenched. By making use of the sensitive dependence of infrared ν2 absorption on the orientation of the NO2 radicals, rotation angle of NO2 at the regions was estimated through the topographic (point by point) measurements of the infrared absorption. Topographic coincidence between X-ray topographs and infrared absorption was confirmed. Present study is the first work which had detected orientational change of molecules in a single crystal by using infrared absorption measurements in cooperation with X-ray topography.