Abstract
Our former investigation for the effects of localization on the superconducting critical temperature of thin films are extended to much dirty cases where τ−1>>ωD, ωD being the Debye frequency, but still in the weakly localized regime, i.e. h⁄(2πEFτ)<1, EF and τ being the Fermi energy and the life time, respectively. The depression of the critical temperature to the first order in h⁄(2πEFτ) is shown to be proportional to the inverse of the film thickness, 1⁄d, i.e. to the sheet resistance (Remark: Graphics omitted.), in the wide range of the thickness within the present region of interest where \sqrthD⁄kBT>>d>>l, D being the diffusion constant, T the temperature and l the mean free path. The proportionality factor depends on the details of the interaction processes among electrons.