Journal of Surface Analysis
Online ISSN : 1347-8400
Print ISSN : 1341-1756
ISSN-L : 1341-1756
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How to express the attenuation of signal electrons in surface electron spectroscopy. II. Dielectric function and IMFP
Shigeo Tanuma
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2004 Volume 11 Issue 2 Pages 123-128

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Abstract
This article described a basis of the interaction between electron or photon and solids, which are very important for surface electron spectroscopies such as XPS and AES. Then, we referred to the dielectric function, energy loss function and optical oscillator strength distribution. Based on these things, we also showed an equation of IMFPs which was knows as TPP formula.
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© 2004 by The Surface Analysis Society of Japan
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