Journal of Surface Analysis
Online ISSN : 1347-8400
Print ISSN : 1341-1756
ISSN-L : 1341-1756
Extended Abstract
Applications of Surface Analysis with Fourier Transform Infrared Spectrometer
Tsuyoshi Tsuchibuchi
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2008 Volume 15 Issue 1 Pages 85-88

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Abstract

  Fourier Transform Infrared Spectrometer includes a variety of measurement techniques, such as attenuated total reflection (ATR) and reflection absorption spectroscopy (RAS), which are effective for analysis of both surfaces and thin films. In addition, performing ATR together with an infrared microscope enables surface analysis of minute areas. This report introduces thin-film analysis applications, such as the measurement of Fibrinogen monomolecular films using these two techniques.

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© 2008 The Surface Analysis Society of Japan
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