Journal of Surface Analysis
Online ISSN : 1347-8400
Print ISSN : 1341-1756
ISSN-L : 1341-1756
Extended Abstracts of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09)
An Improved Backscattering Correction Equation for Wide Analytical Conditions on Quantitative Auger Analysis
S. Tanuma
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2009 Volume 15 Issue 3 Pages 312-316

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Abstract

  We have described the electron backscattering correction for Auger analysis. Ichimura-Shimizu equation has been frequently used for this correction, but has limitations for incident electron energies and angles. Then, we have proposed an improved correction for the backscattering correction that could be applied to the wide analytical conditions based on the Ichimura-Shimizu equation.

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© 2009 The Surface Analysis Society of Japan
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