Abstract
In organic light-emitting devices (OLEDs), optoelectronic functions are separated into multiple organic stacked layers sandwiched by a pair of electrodes, and the stacked layer structure has great impacts on the device characteristics．However, each organic layer has a very thin thickness from only several nm to several tens of nm, and the precise evaluation of the thickness is difficult． In this context, we focused on non-destructive neutron reflectivity (NR) measurements for the precise evaluation of layer structures． In this article, we report solution-processed stacked organic/organic layer structures investigated by NR, and their influences on OLED performances.
