Journal of Surface Analysis
Online ISSN : 1347-8400
Print ISSN : 1341-1756
ISSN-L : 1341-1756
Extended Abstracts from 8th International Symposium on Practical Surface Analysis (PSA19)
Novel approaches for analyzing nanoparticles using Atom Probe Tomography
Pyuck-Pa ChoiSe Ho KimKyuseon Jang
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2019 Volume 26 Issue 2 Pages 140-141

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Abstract
In this work, we present a novel approach for preparing atom probe tomography (APT) specimens from Pd electrocatalyst nanoparticles of less than 10 nm in size. This method is based on electrophoresis of nanoparticles on a substrate followed by electroplating of a metallic layer. Using transmission electron microscopy (TEM) we could observe that particle shape and size were well preserved after these two process steps. We could routinely prepare APT specimens from the deposited nanoparticle/metal films using focused-ion- beam milling (FIB). Using APT we were not only able to map the elemental distribution within the nanoparticles but also the distribution of surfactants i. e. stabilizing and shape-controlling agents, used in the synthesis of the nanoparticles.
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© 2019 by The Surface Analysis Society of Japan
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