Journal of Surface Analysis
Online ISSN : 1347-8400
Print ISSN : 1341-1756
ISSN-L : 1341-1756
Paper
Automatic Threshold Estimation from Photoelectron Yield Spectroscopy (PYS) - Automatic Estimation of Analysis Range by Residual Analysis -
Shinjiro Yagyu Michiko Yoshitake
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2020 Volume 27 Issue 1 Pages 15-21

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Abstract
We have developed a mathematical automatic estimation algorithm for deriving the ionization potential from photoelectron yield spectroscopy (PYS). The residuals between the regression line and the data obtained by the Fowler model were calculated by the mean absolute error (MAE) and the mean square root error (RMSE). The analytical range that the Fowler model can be applied is estimated by using the ratio of RMSE/MAE. The estimation was performed by this algorithm using the 87 verification datasets. The correct answer rate was improved to 79% than the conventional fitting (least square method) rate of less than 50%.
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