Abstract
Tapes and films with various functions are our main products. It is important to understand the characteristics of the surface in contact with the adhesive. Therefore, our company focuses on surface analysis, such as Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS). However, its data is very complex and difficult to analyze.
In this presentation, we report the application of principal component analysis (PCA), multivariate curve resolution (MCR) and autoencoder (AE) to the following TOF-SIMS data. Ⅰ: Analysis of oil content on coating film surface Ⅱ: Analysis of residue after tape peeling
As a result, the important features of each component in the samples were extracted by these methods, and then the molecular structures were indicated．
