Determination of Inelastic Mean Free Path of High Energy Electrons from Shape Analysis of K-Auger and K-conversion Spectra Emitted from Thin Films

Abstract

Inelastic mean free paths of electrons were determined from QUASES spectral shape analysis of high energy photoinduced K-Auger spectra of Cu, Ni and Co thin films, as well as of Fe K-conversion spectra attenuated by Au overlayers of various thicknesses. The results found from analysis of spectra from different layer thicknesses are consistent and they are compared with available estimations in the literature.