1988 Volume 50 Issue 4 Pages 57-65
Using the thin layer drying results in the first report, drying constant in a semitheoretical lump model was discussed. As the result, it was found that, even in the same drying curve, a different drying constant was obtained if a different drying period was chosen for the determination of drying constant. Based on the same model, a pair of equations were derived from the heat and mass balances in order to quantitatively define the depth of the thin layer by use of a set of parameters which indicated the degree of deviation from an ideal thin layer. The maximum value of the parameter which gave the maximum thin layer depth was determined. The suitable thickness of a thin layer in drying experiments can be established by using a pair of parametrrc coefficients.